ASTM E1634

1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and scan alignment, and computerized system.

Product Details

Published:

11/01/2019

Number of Pages:

3

File Size:

1 file , 160 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus