IEC 61164 Ed. 2.0 en:2004

IEC 61164 Ed. 2.0 en:2004

$146.00

Reliability growth – Statistical test and estimation methods
standard by International Electrotechnical Commission, 03/24/2004

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Description

Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

Product Details

Edition:
2.0
Published:
03/24/2004
Number of Pages:
55
File Size:
1 file , 780 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus

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