IEEE P2665

Description

IEEE P2665 – IEEE Draft Recommended Practice for Statistical Process Control for EMC Test Laboratories

New IEEE Standard – Active – Draft.This standard provides guidance on how to verify Electromagnetic Compatibility (EMC) test performance through the use of statistical process control (SPC) and specialized setups. By employing SPC a laboratory can monitor the validity of tests by recording data in such a way that trends are detectable and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence to both the laboratory and its customer that test results will be correct.

Product Details

ISBN(s):

9781504489515

Number of Pages:

41

File Size:

1 file , 1.2 MB

Product Code(s):

STDUD25606

Note:

This product is unavailable in Russia, Belarus