IEEE 759

IEEE 759

$80.00

IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Published by Publication Date Number of Pages
IEEE 12/15/1984 0
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Description

IEEE 759 – IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

New IEEE Standard – Inactive-Withdrawn.Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.

Product Details

Published:
12/15/1984
ISBN(s):
0738107158, 9780738107158
Number of Pages:
0
File Size:
1 file , 520 KB
Product Code(s):
STDWD09803
Note:
This product is unavailable in Russia, Belarus

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