IEEE 218

Description

IEEE 218 – IEEE Standard Methods of Testing Transistors

New IEEE Standard – Inactive-Withdrawn.

Product Details

Published:

11/30/1955

ISBN(s):

9781504402095

Number of Pages:

6

File Size:

1 file , 3.5 MB

Product Code(s):

STDWD02568

Note:

This product is unavailable in Russia, Belarus