IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

Published by	Publication Date	Number of Pages
IEEE	12/05/2008	26

Category: IEEE

Description

IEEE 1620 – IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

Revision Standard – Inactive-Reserved.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.