IEEE 1505.1-2008

IEEE 1505.1-2008

$67.00

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
standard by IEEE, 08/01/2013

PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

New IEEE Standard – Superseded.This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).

Product Details

Edition:
1st
Published:
08/01/2013
ISBN(s):
9780738158112, 9780738168579, 9780738185378
Number of Pages:
170
File Size:
1 file , 1.9 MB
Product Code(s):
STDSU95826, STDSU98313
Note:
This product is unavailable in Russia, Belarus

In Demand Now