IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture

Published by	Publication Date	Number of Pages
IEEE	07/28/2017	96

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Category: IEEE

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IEEE 1149.10 – IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture

New IEEE Standard – Active.Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1¿¿¿ to describe and operate the on-chip circuits.