JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

$31.00

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

Published by Publication Date Number of Pages
JEDEC 03/01/1966 9
PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

JEDEC EIA 323 (R2002) – AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

Product Details

Published:
03/01/1966
Number of Pages:
9
File Size:
1 file , 300 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

In Demand Now