Home JIS JIS C 2162 SALE JIS C 2162$49.00 Original price was: $49.00.$29.00Current price is: $29.00. Test method of long-term reliability of gate insulator for SiC devices at high temperaturestandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010 JIS C 2162 quantity Add to cart PDF FormatMulti-User AccessPrintableOnline Download Category: JIS Description JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus Related products IPC 9797 $158.00 Original price was: $158.00.$95.00Current price is: $95.00. Add to cart AWS D1.4/D1.4M $154.00 Original price was: $154.00.$92.00Current price is: $92.00. Add to cart
JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus
