ASTM E2481-12

1.1 This test method provides a procedure to determine the ability of a photovoltaic (PV) module to endure the long-term effects of periodic ???hot spot??? heating associated with common fault conditions such as severely cracked or mismatched cells, single-point open circuit failures (for example, interconnect failures), partial (or non-uniform) shadowing or soiling. Such effects typically include solder melting or deterioration of the encapsulation, but in severe cases could progress to combustion of the PV module and surrounding materials.

Product Details

Published:

12/01/2012

Number of Pages:

5

File Size:

1 file , 220 KB

Redline File Size:

2 files , 570 KB

Note:

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