ASTM F980-10e1

ASTM F980-10e1

$35.00

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
standard by ASTM International, 12/01/2010

PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

Product Details

Published:
12/01/2010
Number of Pages:
7
File Size:
1 file , 160 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

In Demand Now