IEC 60749-13 Ed. 1.0 b

Description

IEC 60749-13 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Product Details

Edition:

1.0

Published:

04/12/2002

Number of Pages:

9

File Size:

1 file , 400 KB

Note:

This product is unavailable in Ukraine, Russia, Belarus