IEC 62047-25 Ed. 1.0 b

Description

IEC 62047-25 Ed. 1.0 b – Semiconductor devices – Micro-electromechanical devices – Part 25: Silicon based MEMS fabrication technology – Measurement method of pull-press and shearing strength of micro bonding area

IEC 62047-25:2016 specifies the in-situ testing method to measure the bonding strength of micro bonding area which is fabricated by micromachining technologies used in silicon-based micro-electromechanical system (MEMS). This document is applicable to the in-situ pull-press and shearing strength measurement of the micro bonding area fabricated by microelectronic technology process and other micromachining technology.

Product Details

Edition:

1.0

Published:

08/29/2016

Number of Pages:

45

File Size:

1 file , 1000 KB

Note:

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