IEC 62047-30 Ed. 1.0 en

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Semiconductor devices – Micro-electromechanical devices – Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

Published by Publication Date Number of Pages
IEC 09/15/2017 20
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IEC 62047-30 Ed. 1.0 en – Semiconductor devices – Micro-electromechanical devices – Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

IEC 62047-30:2017(E) specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film used for micro sensors and micro actuators, and its reporting schema to determine the characteristic parameters for consumer, industry or any other applications of piezoelectric devices. This document applies to piezoelectric thin films fabricated by MEMS process

Product Details

Edition:
1.0
Published:
09/15/2017
Number of Pages:
20
File Size:
1 file , 500 KB
Note:
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