IEEE 1149.10

Description

IEEE 1149.10 – IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture

New IEEE Standard – Active.Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1¿¿¿ to describe and operate the on-chip circuits.

Product Details

Published:

07/28/2017

ISBN(s):

9781504439954, 9781504439961, 9781504442213

Number of Pages:

96

File Size:

1 file , 3.4 MB

Product Code(s):

STD22564, STDPD22564, STDPL22564

Note:

This product is unavailable in Russia, Ukraine, Belarus