IEEE 1450

IEEE 1450

$210.00

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Published by Publication Date Number of Pages
IEEE 09/01/1999 140
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Description

IEEE 1450 – IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

New IEEE Standard – Inactive-Reserved.Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.

Product Details

Published:
09/01/1999
ISBN(s):
0738116467, 9780738116471
Number of Pages:
140
File Size:
1 file , 540 KB
Product Code(s):
STDRES94734
Note:
This product is unavailable in Russia, Belarus

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