IEEE 1505.1

Description

IEEE 1505.1 – IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Revision Standard – Active.An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).

Product Details

Published:

08/20/2019

ISBN(s):

9781504460835, 9781504459754, 9781504459761, 9781504461993, 9781504462006

Number of Pages:

157

File Size:

1 file , 9 MB

Redline File Size:

2 files , 28 MB

Product Code(s):

STD23757, STDRL23757, STDPD23757, STDPDRL23757, STDPL23757

Note:

This product is unavailable in Russia, Ukraine, Belarus