IEEE 1620-2004

IEEE 1620-2004

$80.00

Standard for Test Methods for the Characterization of Organic Transistors and Materials
standard by IEEE, 04/29/2004

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Description

New IEEE Standard – Superseded.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Product Details

Published:
04/29/2004
ISBN(s):
0738139920, 9780738139937
Number of Pages:
20
File Size:
1 file , 140 KB
Product Code(s):
STDSU95219
Note:
This product is unavailable in Russia, Belarus

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