IEEE 1687

Description

IEEE 1687 – IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

New IEEE Standard – Active.A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.

Product Details

Published:

12/05/2014

ISBN(s):

9780738194165, 9780738194172, 9781504416832

Number of Pages:

266

File Size:

1 file , 8 MB

Product Code(s):

STD20033, STDPD20033, STDPL20033

Note:

This product is unavailable in Russia, Ukraine, Belarus