IEEE 2870

IEEE 2870

$34.00

IEEE Guide for Grip Test Method for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-Effect

Published by Publication Date Number of Pages
IEEE n/a 25
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Description

IEEE 2870 – IEEE Guide for Grip Test Method for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-Effect

New IEEE Standard – Active. Introduced in this guide is the grip test method for fittings of high-temperature, low-sag overhead conductor with long-term operating temperature of between 90 °C and 250 °C in the coeffect of the tension and the current.

Product Details

Number of Pages:
25
File Size:
1 file , 3.3 MB
Product Code(s):
STD25256, STDPD25256
Note:
This product is unavailable in Russia, Ukraine, Belarus

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