IEEE 660

IEEE 660

$32.00

IEEE Standard for Semiconductor Memory Test Pattern Language

Published by Publication Date Number of Pages
IEEE 02/18/1986 14
PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

IEEE 660 – IEEE Standard for Semiconductor Memory Test Pattern Language

New IEEE Standard – Inactive-Withdrawn.

Product Details

Published:
02/18/1986
ISBN(s):
9781504404129
Number of Pages:
14
File Size:
1 file , 3.3 MB
Product Code(s):
STDWD10413
Note:
This product is unavailable in Russia, Belarus

In Demand Now