IEEE C62.59

IEEE C62.59

$38.00

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

Published by Publication Date Number of Pages
IEEE 10/31/2019 40
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IEEE C62.59 – IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

New IEEE Standard – Active.Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.

Product Details

Published:
10/31/2019
ISBN(s):
9781504462280, 9781504461191, 9781504461207
Number of Pages:
40
File Size:
1 file , 1.6 MB
Product Code(s):
STD23860, STDPD23860, STDPL23860
Note:
This product is unavailable in Russia, Ukraine, Belarus

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