JEDEC J-STD-035 – JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic components. This method provides users with an acoustic microscopy process reflow for detecting defects non-destructively in plastic packages while achieving reproducibility.
Product Details
Published:
05/01/1999
File Size:
1 file , 150 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
