This publication is to inform all industry participants of a unified procedure to enable consistent measurement across the industry. This document contains the measurement procedures for testing GDDR5.
This document provides the test methodology details on:
CK and WCK Timings: tCK, tWCK, tCH/tCL, tWCKH/tWCKL, CK TJ/RJrms, CK and WCK Jitter
CK and WCK Input Operating Conditions: VIXCK, VIXWCK, VIDCK(ac), VIDWCK(ac), VIDCK(dc),VIDWCK(dc), CKslew, and WCKslew
Data Input Timings: tDIVW, tDIPW
Note: The procedures described in this document are intended to provide information about the tests that will be used in JEDEC GDDR5 recommended measurement parameter. This testing is not a replacement for an exhaustive test validation plan.
Product Details
Published:
2014
Number of Pages:
34
File Size:
1 file , 3 MB
Note:
This product is unavailable in Russia, Ukraine, Belarus
