$62.00Original price was: $62.00.$37.00Current price is: $37.00.
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST standard by JEDEC Solid State Technology Association, 03/01/2009
This method establishes a standard procedure for determining the data cycling endurance and data retention capability of non-volatile memory cells. It is intended as a qualification and monitor test procedure. This test is also applicable to FLASH EEPROM integrated circuits and Erasable Programmable Logic Devices (EPLD) with embedded EEPROM or FLASH memory.
Product Details
Published:
03/01/2009
Number of Pages:
22
File Size:
1 file , 170 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
