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JEDEC JESD 435 (R2009)
Original price was: $62.00.$37.00Current price is: $37.00.
STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
| Published by | Publication Date | Number of Pages |
| JEDEC | 04/01/1976 | 23 |
JEDEC JESD 435 (R2009) – STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435
Product Details
- Published:
- 04/01/1976
- Number of Pages:
- 23
- File Size:
- 1 file , 620 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
