JEDEC JESD28-1 – N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
Product Details
Published:
09/01/2001
Number of Pages:
14
File Size:
1 file , 55 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
