JEDEC JESD28-1

Description

JEDEC JESD28-1 – N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

Product Details

Published:

09/01/2001

Number of Pages:

14

File Size:

1 file , 55 KB

Note:

This product is unavailable in Russia, Ukraine, Belarus