JEDEC JESD340 (R2009) – STANDARD FOR THE MEASUREMENT OF CRE
This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.
Product Details
Published:
11/01/1967
Number of Pages:
13
File Size:
1 file , 410 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
