JEDEC JESD38

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STANDARD FOR FAILURE ANALYSIS REPORT FORMAT

Published by Publication Date Number of Pages
JEDEC 12/01/1995 14
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JEDEC JESD38 – STANDARD FOR FAILURE ANALYSIS REPORT FORMAT

This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood by customers. Additional objectives are to ensure that reports can be easily ready by users, satisfactorily reproduced on copying machines, adequately transmitted by telefax, and conveniently stored in standard filing cabinets.

Product Details

Published:
12/01/1995
Number of Pages:
14
File Size:
1 file , 280 KB
Note:
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