JEDEC JESD51-50

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Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)

Published by Publication Date Number of Pages
JEDEC 04/18/2012 12
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JEDEC JESD51-50 – Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)

This document provides an overview of the methodology necessary for making meaningful thermal measurements on high-power light-emitting diodes (LEDs) built on single or multiple chips with one or more pn-junctions per chip. The actual methodology components are contained in separate detailed documents.

Product Details

Published:
04/18/2012
Number of Pages:
12
File Size:
1 file , 73 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus