JEDEC JESD51-6

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INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)

Published by Publication Date Number of Pages
JEDEC 03/01/1999 8
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JEDEC JESD51-6 – INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)

This standard specifies the environmental conditions for determining thermal performance of an integrated circuit device in a forced convection environment when mounted on a standard thermal test board.

Product Details

Published:
03/01/1999
Number of Pages:
8
File Size:
1 file , 470 KB
Note:
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