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JEDEC JESD51-6
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INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)
Published by | Publication Date | Number of Pages |
JEDEC | 03/01/1999 | 8 |
JEDEC JESD51-6 – INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)
This standard specifies the environmental conditions for determining thermal performance of an integrated circuit device in a forced convection environment when mounted on a standard thermal test board.
Product Details
- Published:
- 03/01/1999
- Number of Pages:
- 8
- File Size:
- 1 file , 470 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus