JEDEC JESD6 (R2002) – MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
Product Details
Published:
02/01/1967
Number of Pages:
17
File Size:
1 file , 280 KB
Note:
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