JEDEC JESD91B – Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
The method described in this document applies to all reliability mechanisms associated with electronic devices.
The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.
Product Details
Published:
03/01/2022
Number of Pages:
20
File Size:
1 file , 370 KB
Note:
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