Home JIS JIS C 2162 SALE JIS C 2162$49.00 Original price was: $49.00.$29.00Current price is: $29.00. Test method of long-term reliability of gate insulator for SiC devices at high temperaturestandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010 JIS C 2162 quantity Add to cart PDF FormatMulti-User AccessPrintableOnline Download Category: JIS Description JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus Related products IPC D-310C $131.00 Original price was: $131.00.$79.00Current price is: $79.00. Add to cart IPC 9701B $94.00 Original price was: $94.00.$56.00Current price is: $56.00. Add to cart IPC TA-722 $416.00 Original price was: $416.00.$250.00Current price is: $250.00. Add to cart AS 5235.1 $40.00 Original price was: $40.00.$20.00Current price is: $20.00. Add to cart
JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus
