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JIS C 5003
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General test procedure of failure rate for electronic components
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1974
JIS C 5003 – General test procedure of failure rate for electronic components
Product Details
- Published:
- 01/01/1974
- File Size:
- 1 file , 440 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
